Today's technological demands in areas such as microelectronics, micro-optics, photonics and nanomedicine have reached a point where the use of traditional thermometry is becoming a limiting factor, if not an obstacle to accurate temperature measurements. In this fundamental project, we propose to develop a new methodology based on the use of X-ray absorption spectroscopy to measure the temperature of a material by analysing the fine-structure amplitude of the X-ray absorption spectrum. The proposed method for temperature measurements is focused on, but not limited to, temperature mapping in multilayer chips and plasmonic nanoparticles. The project is compliant with the Research and Innovation Strategies for Smart Specialisation (RIS3) of Latvia in the area of "Smart materials, technologies and engineering systems".

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