Institute of Solid State Physics EXAFS Spectroscopy Laboratory
Institute of Solid State Physics, University of Latvia
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Electron Microscopy

(1989-1997, A. Sazonov, A. Kuzmin, J. Purans)

The laboratory EXAFS-spectrometer was created at the Institute of Solid State Physics on the base of the conventional diffractometer DRON-3M. It allows to measure the x-ray absorption spectra of elements having the absorption edges from 5 KeV to 20 KeV.

To focus X-ray radiation, the Johann scheme with the bent alpha-quartz (1011) crystal-monochromator is used. During measurements the bent of the crystal remains constant (the defocusing of radiation is insignificant so that the change of intensity in the range up to 600 eV above absorption edge does not exceed 10%). The counting rate of the monochromatized zero beam from the conventional x-ray tube is about 105 counts per second with the resolution about 6 eV.

Main reference:
A. Kuzmin, N. Mironova, J. Purans and A. Sazonov,
EXAFS and XANES study of CoxMg1-xO solid solutions using laboratory EXAFS-spectrometer,
Phys. Stat. Sol. (a) 135 (1993) 133-141.

Related publications:
A. I. Sazonov, A. J. Kuzmin, J. J. Purans, S. V. Stefanovskii,
Structural state of cobalt ion in sodium-borate and sodium-borosilicate glasses,
Zh. Prikl. Spectrosk. 55 (1991) 295-299 [in Russian]; J. Appl. Spectrosc. (USSR) 55 (1991) 824-827.

S. V. Stefanovskii, A. I. Sazonov, A. J. Kuzmin, J. J. Purans,
Local environment of cobalt atoms in borosilicate glasses,
Fiz. Khim. Stekla 17 (1991) 744-749 [in Russian]; Sov. J. Glass Phys. and Chem. 17 (1991) 413-418.

A. Kuzmin, J. Purans, A. Sazonov, N. Mironova,
Studies of CoxMg1-xO solid solutions using laboratory EXAFS-spectrometer,
Jpn. J. Appl. Phys. 32 (1993) Suppl. 32-2 637-639.

A. J. Kuzmin, J.J. Purans, A. I. Sazonov, S. V. Stefanovskii,
X-ray absorption spectra of cesium ions in sodium-borosilicate and aluminium-phosphate glasses,
Zh. Prikl. Spectrosk. 58 (1993) 538-543 [in Russian]; J. Appl. Spectrosc. (USSR) 58 (1993) 418-422.

Comparison of the Ni K-edge in cubic NiO measured using synchrotron radiation and laboratory EXAFS-spectrometer