|
|
|
Wednesday,
16 November 2005
14:00 - 17:00
|
|
Photon
detection
|
|
Element-Specific
Contrast in Local Probe Microscopy via X-Ray Spectroscopy: Present Status
and Future Perspectives
|
J
Purans, ISSP - Riga -Latvia |
|
Scanning
µ-x ray excited luminescence in semiconductors
|
G
Martinez-Criado, ESRF - Grenoble - France |
| First
Attempt to Use Conductive AFM for chemical nanocharacterizing |
V
Sammelselg, University of Tartu - Estonia |
| General
discussion |
|
|
Thursday,
17 November 2005
09:00 - 17:00
|
|
Electron
detection
|
| Combination
of Atomic Force Microscopy and X ray beam : experimental set up and objectives |
J
Chevrier, UJF LEPES - Grenoble - France |
|
Towards
Charge and Photon Imaging of Nanostructures Using X-UV Pumped Scanning
Probes
|
B
Hamilton, School of Electrical Engineering and Electronics - Manchester
- UK |
| Coupling
of Scanning Tunneling Microscope with Hard X-ray Micro-Beam from 27m Long
Undulator at SPring-8 |
A
Saito, Osaka University & RIKEN/SPring8 - Osaka - Japan |
|
Combination
of Scanning Probe Microscope and X-rays for Detection of Electrons
|
O
Dhez, OGG, INFM/CNR - Grenoble - France |
|
Instrumentation
development and related issues
|
|
Simultaneous
resistance and capacitance cartography by conducting probe atomic force
microscopy in contact mode
|
P
Chrétien, Laboratoire de génie électrique de Paris - Paris - France |
| Towards
Soft X-ray Scanning Microscopy Using Tapered Capillaries & Laser-Based
High-Harmonic Sources |
W
S Brocklesby, Optoelectronics Research Centre - Southampton University
- UK |
| Magneto-optical
Scanning Near-field Microscopy |
L
M Alvarez-Prado, Departamento de Fisica - Ovieado - Spain |
| General
discussion |
|
| Poster
session |
|
Development
of Laboratory Setup
for X-Ray/AFM Experiments
|
A
Kuzmin, Institute of Solid State Physics - Riga - Latvia |
| Towards
X-Ray Diffraction on Single Islands |
R K Mundboth,
ESRF - Grenoble - France |
| Nano-XEOL
using near-field detection |
D Pailharey,
CRMCN - Campus de Luminy - Marseille - France |
| Local
collection with a STM tip of photoelectrons emitted by a surface irradiated
by visible or UV laser beam |
D Tonneau,
CRMCN - Campus de Luminy - Marseille - France |
|
Friday,
18 November 2005
09:00 - 12:00
|
|
IR-SNOM
|
|
Near-Field
Scanning Optical Microscopy: a brief overview
|
S
Huant, UJF Grenoble & CNRS - Grenoble - France |
| Near-Field
Infrared Microscopy: Overview and perspectives |
A
Cricenti, ISM-CNR - Rome - Italy & Vanderbilt University - Nashville
- USA |
| From
apertureless near-field optical microscopy to infrared near-field night
vision |
Y
DeWilde, ESPCI - Paris - France |
|
Edge
Radiation IR end-station at ESRF
|
J
Susini, ESRF - Grenoble - France |
|
General discussion
End
of the workshop
|
|
