Atomic Force Microscopy (AFM) is a type of scanning probe microscopy using
a microscale cantilever with a sharp tip (probe) at its end that is used to scan the specimen surface.
Our AFM is a stand-alone model "SMENA-A", made by NT-MDT.
It performs scanning by probe (tip) and has a 50x50x2.5 µm piezo-scanner. The sample is placed
under the AFM on a manual (X,Y) positioning (5x5 mm with resolution 5 micrometers) stage.
To ensure reliable operation, the AFM is located on top of the Pneumatic Vibration Isolation Workstation,
composed of a Honeycomb Table Top (600x900x120 mm, Model 1HBW06-09-085 by STANDA),
Pneumatic Vibration Isolation System and a guarding Armrest (Model 1VIS95W-04-07-70 by STANDA).
The AFM can operate in the following modes:
Contact AFM (contact topography) - topography measurement in the contact mode when the
probe tip glides over the sample surface in direct contact with it.
Force imaging method - obtaining force image by scanning the surface in the contact mode
with a fixed height value (with fixed value of the scanner z coordinate).
Lateral Force Microscopy - measuring the local friction force distribution over the surface
Force modulation method - acquiring the image of local viscoelasticity on the surface
Adhesion Force Microscopy - acquiring the image of adhesion force on the surface sample.
Spreading Resistance Imaging.
Semi-contact AFM (semi-contact topography) - measuring surface topography in semicontact
mode based on vibration technique in which the oscillating probe tip slightly knocks the
sample surface during scanning.
Phase Imaging - ensures the object surface structure detail contrast based on local differences
of the surface adhesion and viscoelasticity.
Non-contact AFM (non-contact topography) - measuring surface topography in non-contact
mode based on vibration technique in which the oscillating probe tip has no direct contact with
the sample surface during scanning.
Magnetic Force Microscopy - acquiring images of the surface magnetic structure based on
local differences in magnetic field distribution.
Electrostatic Force Microscopy - acquiring images of the surface structure details based
on local differences in electric field distribution.
Kelvin Probe Microscopy - measuring the electric potential distribution over the sample
Scanning Capacitance Microscopy - acquiring images of local surface electric capacitance
distribution in the sample - conductive tip system.
Atomic Force Microscopy by Wikipedia.
Atomic Force F&E
Schaefer Technologie GmbH
Capacitive Position Sensors / Controllers
SPI Supplies - service providers to the microscopy and microanalysis community.
Gwyddion - free SPM (AFM, SNOM/NSOM, STM, MFM, ... ) data analysis software.