Institute of Solid State Physics Laboratory of Materials Morphology and Structure Investigations
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  • Phenom Pro - a desktop scanning electron microscope.

  • SEM-FIB Tescan Lyra XM - SEM with Schottky field emission cathode in combination with gallium Focused Ion Beam (FIB) column and with Gas Injection System (GIS).

  • TEM FEI Tecnai GF20 offers imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries.

  • NT-MDT Stand Alone "SMENA" Scanning Probe Microscope
        Download description in PDF format.


  • "Nanofinder S" 3D Scanning Confocal Microscope with Spectrometer
        Download Specifications and Users Manual in PDF format.