Institute of Solid State Physics Laboratory of Materials Morphology and Structure Investigations
Fax: (+371) 67132778    Phone: (+371) 67251691

LU CFI Webmail

QR code

Google Search:



Large Visitor Map

Website Statistics








Electron Microscopy

Electron microscopy is a type of microscopy that uses a beam of electrons to create an image of the specimen. There are two main types of electron microscopes: Scanning Electron Microscope (SEM) and Transmission Electron Microscope (TEM). They allow one to observe specimens in vacuum with down to atomic resolution.

In our laboratory, we use electron microscopy to study morphology and structure of nanocrystals, thin films and nanowires of different materials.



SEM image SEM image SEM image
TEM image TEM image



USEFUL LINKS

  • Electron Microscope - Wikipedia.
  • Scanning Electron Microscope - Wikipedia.
  • Transmission Electron Microscope - Wikipedia.

  • Phenom Pro - a desktop scanning electron microscope.
  • SEM-FIB Tescan Lyra XM - SEM with Schottky field emission cathode in combination with gallium Focused Ion Beam (FIB) column and with Gas Injection System (GIS).
  • TEM FEI Tecnai GF20 offers imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries.